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FlexCT TERMINATED

Flexible and open-source tool for accurate reconstruction using industrial X-ray computed tomography

Total Cost €

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EC-Contrib. €

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Partnership

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Project "FlexCT" data sheet

The following table provides information about the project.

Coordinator
MATERIALISE NV 

Organization address
address: TECHNOLOGIELAAN 15
city: HEVERLEE
postcode: 3001
website: www.materialise.com

contact info
title: n.a.
name: n.a.
surname: n.a.
function: n.a.
email: n.a.
telephone: n.a.
fax: n.a.

 Coordinator Country Belgium [BE]
 Project website https://www.materialise.com/en/manufacturing/certified-additive-manufacturing/research-development
 Total cost 160˙800 €
 EC max contribution 160˙800 € (100%)
 Programme 1. H2020-EU.1.3.2. (Nurturing excellence by means of cross-border and cross-sector mobility)
 Code Call H2020-MSCA-IF-2016
 Funding Scheme MSCA-IF-EF-SE
 Starting year 2017
 Duration (year-month-day) from 2017-12-01   to  2019-12-17

 Partnership

Take a look of project's partnership.

# participants  country  role  EC contrib. [€] 
1    MATERIALISE NV BE (HEVERLEE) coordinator 160˙800.00

Map

 Project objective

Our ability to achieve breakthroughs in manufacturing is dependent on our capacity to measure the features that define these breakthroughs. In other words, we can manufacture only as well as we can measure. Recent trends indicate that the future of mass production is in additive manufacturing (AM). X-ray computed tomography (CT) is the optimal solution for quantitative inspection of AM products as it is currently the only technology that can perform non-destructive measurements of both internal and external features. However, the reliability of CT measurements is not yet established and the application of CT for product inspection is limited to qualitative tasks. FlexCT is a multi-disciplinary research project that answers the imminent need to bring CT to measurement maturity to keep the pace with the improvements and wider adoption of AM. The fields of dimensional metrology, software engineering, and manufacturing are combined to produce an effective and open solution for the decisive adoption of CT to inspection of AM and other high-value products. The candidate’s research experience is overwhelmingly in the field of dimensional metrology. Materialise and UAntwerp’s Vision Lab are selected strategically to ensure the successful execution of the project and to provide the candidate with exposure and training in new disciplines and work environments. Materialise is one of the world’s leading companies in AM technology and is proposed as the host institution for this project. The candidate’s exposure to and feedback from a manufacturer will allow the proposed solution to be optimized for the needs of the end-user. The secondment and collaboration with UAntwerp’s Vision Lab provides knowledge and support for tomographic reconstruction algorithms and software engineering. Dedicated training in additive manufacturing, software engineering, and leadership skills will help the candidate achieve his career goal of becoming an independent principal research scientist.

 Publications

year authors and title journal last update
List of publications.
2020 Lei Yang, Massimiliano Ferrucci, Raya Mertens, Wim Dewulf, Chunze Yan, Yusheng Shi, Shoufeng Yang
An investigation into the effect of gradients on the manufacturing fidelity of triply periodic minimal surface structures with graded density fabricated by selective laser melting
published pages: 116367, ISSN: 0924-0136, DOI: 10.1016/j.jmatprotec.2019.116367
Journal of Materials Processing Technology 275 2019-09-26
2019 Lei Yang, Raya Mertens, Massimiliano Ferrucci, Chunze Yan, Yusheng Shi, Shoufeng Yang
Continuous graded Gyroid cellular structures fabricated by selective laser melting: Design, manufacturing and mechanical properties
published pages: 394-404, ISSN: 0264-1275, DOI: 10.1016/j.matdes.2018.12.007
Materials & Design 162 2019-05-23
2018 Massimiliano Ferrucci, Evelina Ametova, Gabriel Probst, Tom Craeghs, Wim Dewulf
Sensitivity of CT dimensional measurements to rotation stage errors
published pages: , ISSN: 1435-4934, DOI:
8th Conference on Industrial Computed Tomography 2019-05-23
2018 Massimiliano Ferrucci, Petr Heřmánek, Evelina Ametova, Simone Carmignato, Wim Dewulf
Measurement of the X-ray computed tomography instrument geometry by minimization of reprojection errors—Implementation on simulated data
published pages: 7-20, ISSN: 0141-6359, DOI: 10.1016/j.precisioneng.2018.03.012
Precision Engineering 54 2019-05-23
2018 Evelina Ametova, Massimiliano Ferrucci, Suren Chilingaryan, Wim Dewulf
Software-based compensation of instrument misalignments for X-ray computed tomography dimensional metrology
published pages: 233-242, ISSN: 0141-6359, DOI: 10.1016/j.precisioneng.2018.05.016
Precision Engineering 54 2019-05-23
2018 Wim Dewulf, Massimiliano Ferrucci, Evelina Ametova, Petr Heřmánek, Gabriel Probst, Bart Boeckmans, Tom Craeghs, Simone Carmignato
Enhanced dimensional measurement by fast determination and compensation of geometrical misalignments of X-ray computed tomography instruments
published pages: 523-526, ISSN: 0007-8506, DOI: 10.1016/j.cirp.2018.04.124
CIRP Annals 67/1 2019-05-23
2018 Massimiliano Ferrucci, Petr Heřmánek, Evelina Ametova, Elia Sbettega, Michal Vopalensky, Ivana Kumpová, Daniel Vavřík, Simone Carmignato, Tom Craeghs, Wim Dewulf
Measurement of the X-ray computed tomography instrument geometry by minimization of reprojection errors—Implementation on experimental data
published pages: 107-117, ISSN: 0141-6359, DOI: 10.1016/j.precisioneng.2018.05.007
Precision Engineering 54 2019-05-23
2019 Evelina Ametova, Massimiliano Ferrucci, Wim Dewulf
Software-based compensation of CT instrument misalignments - experimental study
published pages: , ISSN: , DOI:
9th Conference on Industrial Computed Tomography 2019-05-16
2018 Evelina Ametova, Massimiliano Ferrucci, Suren Chilingaryan, Wim Dewulf
A computationally inexpensive model for estimating dimensional measurement uncertainty due to x-ray computed tomography instrument misalignments
published pages: 65007, ISSN: 0957-0233, DOI: 10.1088/1361-6501/aab1a1
Measurement Science and Technology 29/6 2019-08-29

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