Explore the words cloud of the PICOMETRICS project. It provides you a very rough idea of what is the project "PICOMETRICS" about.
The following table provides information about the project.
|Coordinator Country||Belgium [BE]|
|Total cost||1˙998˙750 €|
|EC max contribution||1˙998˙750 € (100%)|
1. H2020-EU.1.1. (EXCELLENT SCIENCE - European Research Council (ERC))
|Duration (year-month-day)||from 2018-05-01 to 2023-04-30|
Take a look of project's partnership.
|1||UNIVERSITEIT ANTWERPEN||BE (ANTWERPEN)||coordinator||1˙998˙750.00|
Understanding nanostructures down to the atomic level is the key to optimise the design of advanced materials with revolutionary novel properties. This requires characterisation methods enabling one to quantify atomic structures with high precision.
The strong interaction of accelerated electrons with matter makes that transmission electron microscopy is one of the most powerful techniques for this purpose. However, beam damage, induced by the high energy electrons, strongly hampers a detailed interpretation. To overcome this problem, I will usher electron microscopy in a new era of non-destructive picometer metrology. This is an extremely challenging goal in modern technology because of the increasing complexity of nanostructures and the role of light elements such as lithium or hydrogen. Non-destructive picometer metrology will allow us to answer the question: what is the position, composition and bonding of every single atom in a nanomaterial even for light elements?
There has been significant progress with electron microscopy to study beam-hard materials. Yet, major problems exist for radiation-sensitive nanostructures because of the lack of physics-based models, detailed statistical analyses, and optimal design of experiments in a self-consistent computational framework. In this project, novel data-driven methods will be combined with the latest experimental capabilities to locate and identify atoms, to detect light elements, to determine the three-dimensional ordering, and to measure the oxidation state from single low-dose recordings. The required electron dose is envisaged to be four orders of magnitude lower than what is nowadays used. In this manner, beam damage will be drastically reduced or even be ruled out completely.
The results of my programme will enable precise characterisation of nanostructures in their native state; a prerequisite for understanding their properties. Clearly this is important for the design of a broad range of nanomaterials.
|year||authors and title||journal||last update|
Knut MÃ¼ller-Caspary, Tim Grieb, Jan MÃ¼ÃŸener, Nicolas Gauquelin, Pascal Hille, JÃ¶rg SchÃ¶rmann, Johan Verbeeck, Sandra Van Aert, Martin Eickhoff, Andreas Rosenauer
Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy
published pages: , ISSN: 0031-9007, DOI: 10.1103/PHYSREVLETT.122.106102
|Physical Review Letters 122/10||2019-12-17|
K.H.W. van den Bos, L. Janssens, A. De Backer, P.D. Nellist, S. Van Aert
The atomic lensing model: New opportunities for atom-by-atom metrology of heterogeneous nanomaterials
published pages: 155-162, ISSN: 0304-3991, DOI: 10.1016/j.ultramic.2018.12.004
Sandra Van Aert, Annick De Backer, Lewys Jones, Gerardo T. Martinez, Armand BÃ©chÃ©, Peter D. Nellist
Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy
published pages: , ISSN: 0031-9007, DOI: 10.1103/PHYSREVLETT.122.066101
|Physical Review Letters 122/6||2019-12-16|
Thomas Altantzis, Ivan Lobato, Annick De Backer, Armand BÃ©chÃ©, Yang Zhang, Shibabrata Basak, Mauro Porcu, Qiang Xu, Ana SÃ¡nchez-Iglesias, Luis M. Liz-MarzÃ¡n, Gustaaf Van Tendeloo, Sandra Van Aert, Sara Bals
Three-Dimensional Quantification of the Facet Evolution of Pt Nanoparticles in a Variable Gaseous Environment
published pages: 477-481, ISSN: 1530-6984, DOI: 10.1021/ACS.NANOLETT.8B04303
|Nano Letters 19/1||2019-12-16|
Knut MÃ¼ller-Caspary, Florian F. Krause, Florian Winkler, Armand BÃ©chÃ©, Johan Verbeeck, Sandra Van Aert, Andreas Rosenauer
Comparison of first moment STEM with conventional differential phase contrast and the dependence on electron dose
published pages: 95-104, ISSN: 0304-3991, DOI: 10.1016/J.ULTRAMIC.2018.12.018
J. Fatermans, S. Van Aert, A.J. den Dekker
The maximum a posteriori probability rule for atom column detection from HAADF STEM images
published pages: 81-91, ISSN: 0304-3991, DOI: 10.1016/j.ultramic.2019.02.003
J. Fatermans, A.â€‰J. den Dekker, K. MÃ¼ller-Caspary, I. Lobato, C.â€‰M. Oâ€™Leary, P.â€‰D. Nellist, S. Van Aert
Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images
published pages: , ISSN: 0031-9007, DOI: 10.1103/PHYSREVLETT.121.056101
|Physical Review Letters 121/5||2019-12-16|
Giulio Guzzinati, Thomas Altantzis, Maria Batuk, Annick De Backer, Gunnar Lumbeeck, Vahid Samaee, Dmitry Batuk, Hosni Idrissi, Joke Hadermann, Sandra Van Aert, Dominique Schryvers, Johan Verbeeck, Sara Bals
Recent Advances in Transmission Electron Microscopy for Materials Science at the EMAT Lab of the University of Antwerp
published pages: 1304, ISSN: 1996-1944, DOI: 10.3390/ma11081304
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