IBAHMA

Ion Beam Applications to High-density Memory Archives

 Coordinatore THE UNIVERSITY OF EXETER 

 Organization address address: Northcote House, The Queen's Drive
city: EXETER
postcode: EX4 4QJ

contact info
Titolo: Dr.
Nome: Enda
Cognome: Clarke
Email: send email
Telefono: +44 1392 723744
Fax: +44 1392 723686

 Nazionalità Coordinatore United Kingdom [UK]
 Totale costo 117˙213 €
 EC contributo 117˙213 €
 Programma FP7-PEOPLE
Specific programme "People" implementing the Seventh Framework Programme of the European Community for research, technological development and demonstration activities (2007 to 2013)
 Code Call FP7-PEOPLE-2009-IEF
 Funding Scheme MC-IEF
 Anno di inizio 2011
 Periodo (anno-mese-giorno) 2011-01-05   -   2012-01-04

 Partecipanti

# participant  country  role  EC contrib. [€] 
1    THE UNIVERSITY OF EXETER

 Organization address address: Northcote House, The Queen's Drive
city: EXETER
postcode: EX4 4QJ

contact info
Titolo: Dr.
Nome: Enda
Cognome: Clarke
Email: send email
Telefono: +44 1392 723744
Fax: +44 1392 723686

UK (EXETER) coordinator 117˙213.60

Mappa


 Word cloud

Esplora la "nuvola delle parole (Word Cloud) per avere un'idea di massima del progetto.

sic    optical    ultra    storage    implanted    material    gt    archival    longevity    ga    precise    determined    incorporation    absorption    ion    contrast    films    density    treatments    potentially    implantation    species    data    post    fib   

 Obiettivo del progetto (Objective)

'Nowadays, safe archival data storage has become an urgent issue. The IBAHMA project concerns a new approach to providing ultra-stable (>50 years), ultra-high density (>1Tbit/sq.in.) data storage for archival applications, using ion-implantation to write nanoscale data into hydrogenated amorphous silicon carbide (a-SiC:H) films. Wide bandgap optical materials, such as a-SiC:H, when exposed to moderate ion doses develop useful optical contrast between regions of different irradiation levels. Absorption coefficient change of 1-2 orders of magnitude can be achieved by ion bombardment with chemically active species, like Ga. The optical contrast formation mechanism is based on the ion beam induced structural and chemical modification of the implanted material, leading to considerable optical band-gap decrease and hence optical absorption increase. Furthermore, high-resolution digital (or analog) features of about 10 nm minimum size can be generated using focused ion beams (FIB), leading potentially to ultra-high storage densities. The use of Ga as an implanted species is of particular interest due to its widespread use in FIB systems and its relatively low melting point, which favours Ga incorporation as dispersed clusters or small nanoparticles in the host material. In this project, the precise nature of Ga incorporation into a-SiC:H films will be investigated, and the role of implantation conditions and post-implantation treatments on the achievable data density, readout contrast and data longevity will be investigated, and optimised conditions determined. In particular the precise role of temperature, both of the SiC 'target' during implantation and of post-implantation annealing treatments in determining the data storage characteristics (density, contrast, longevity) will be determined. The likely limitations for the practical application of this potentially very important new approach to data storage will also be assessed.'

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