NanoBits

Exchangeable and Customizable Scanning Probe Tips

 Coordinatore OFFIS EV 

 Organization address address: Escherweg 2
city: OLDENBURG
postcode: 26121

contact info
Titolo: Dr.
Nome: Albert
Cognome: Sill
Email: send email
Telefono: +49 441 798 4297
Fax: +49 441 798 4267

 Nazionalità Coordinatore Germany [DE]
 Totale costo 3˙239˙926 €
 EC contributo 2˙499˙998 €
 Programma FP7-ICT
Specific Programme "Cooperation": Information and communication technologies
 Code Call FP7-ICT-2009-5
 Funding Scheme CP
 Anno di inizio 2010
 Periodo (anno-mese-giorno) 2010-09-01   -   2013-08-31

 Partecipanti

# participant  country  role  EC contrib. [€] 
1    OFFIS EV

 Organization address address: Escherweg 2
city: OLDENBURG
postcode: 26121

contact info
Titolo: Dr.
Nome: Albert
Cognome: Sill
Email: send email
Telefono: +49 441 798 4297
Fax: +49 441 798 4267

DE (OLDENBURG) coordinator 0.00
2    DANMARKS TEKNISKE UNIVERSITET

 Organization address address: Anker Engelundsvej 1, Building 101A
city: KONGENS LYNGBY
postcode: 2800

contact info
Titolo: Prof.
Nome: Peter
Cognome: Boggild
Email: send email
Telefono: +45 4525 5723
Fax: +45 4588 7762

DK (KONGENS LYNGBY) participant 0.00
3    EIDGENOESSISCHE MATERIALPRUEFUNGS- UND FORSCHUNGSANSTALT

 Organization address address: Ueberlandstrasse
city: DUEBENDORF
postcode: 8600

contact info
Titolo: Dr.
Nome: Johann
Cognome: Michler
Email: send email
Telefono: +41 33 2284605
Fax: +41 33 2284490

CH (DUEBENDORF) participant 0.00
4    FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V

 Organization address address: Hansastrasse
city: MUENCHEN
postcode: 80686

contact info
Titolo: Mr.
Nome: Maximilian
Cognome: Steiert
Email: send email
Telefono: +49 89 1205 2721
Fax: +49 89 1205 7534

DE (MUENCHEN) participant 0.00
5    JPK INSTRUMENTS AG

 Organization address address: BOUCHESTRASSE
city: BERLIN
postcode: 12435

contact info
Titolo: Mr.
Nome: Jörn
Cognome: Kamps
Email: send email
Telefono: +49 30 5331 12070
Fax: +49 30 5331 22555

DE (BERLIN) participant 0.00
6    NANOWORLD SERVICES GMBH

 Organization address address: SCHOTTKYSTRASSE
city: ERLANGEN
postcode: 91058

contact info
Titolo: Mr.
Nome: Thomas
Cognome: Sulzbach
Email: send email
Telefono: +49 9131 761200
Fax: +49 9131 761260

DE (ERLANGEN) participant 0.00

Mappa


 Word cloud

Esplora la "nuvola delle parole (Word Cloud) per avere un'idea di massima del progetto.

afm    materials    force    beam    realize    critical    nanooptical    structures    tips    micro    scanning    wavelength    standard    atomic    nanobits    efficient   

 Obiettivo del progetto (Objective)

The atomic force microscope (AFM) has become a standard and wide spread instrument for characterizingnanoscale devices and can be found in most of today's research and development areas. The NanoBitsproject provides exchangeable and customizable scanning probe tips that can be attached to standard AFMcantilevers offering an unprecedented freedom in adapting the shape and size of the tips to the surfacetopology of the specific application. NanoBits themselves are 2-4 μm long and 120-150 nm thin flakes ofheterogeneous materials fabricated in different approaches. These novel tips will allow for characterizing threedimensional high-aspect ratio and sidewall structures of critical dimensions such as nanooptical photoniccomponents and semiconductor architectures which is a bottle-neck in reaching more efficient manufacturingtechniques. It is thus an enabling approach for almost all future nanoscale applications.

A miniaturized robotic microsystem combining innovative nanosensors and actuators will be used to explorenew strategies of micro-nano-integration in order to realize a quick exchange of NanoBits. For the fabricationof the NanoBits, two different techniques are proposed. On the one hand, a standard silicon processingtechnique enables batch fabrication of various NanoBits designs defined by electron beam lithography. On theother hand, focused ion beam milling can be used to structure a blank of heterogeneous materials, the socallednembranes. Novel scanning modes in atomic force microscopy will be developed to take full advantageof the different NanoBits geometries and to realize AFM imaging of critical dimension structures. Theinnovative nanoimaging capabilities will be applied to characterize and develop novel nanooptical photonicstructures in the wavelength or even sub-wavelength range and TERS applications in the nanomaterial andbiomedical sector. Especially the involved SMEs will exploit and disseminate the results to potential users torealize a more efficient micro-and nanomanufacturing.

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