Opendata, web and dolomites


Defect Simulation and Material Growth of III-V Nanostructures- European Industrial Doctorate Program

Total Cost €


EC-Contrib. €






Project "DESIGN-EID" data sheet

The following table provides information about the project.


Organization address
postcode: G12 8QQ

contact info
title: n.a.
name: n.a.
surname: n.a.
function: n.a.
email: n.a.
telephone: n.a.
fax: n.a.

 Coordinator Country United Kingdom [UK]
 Total cost 878˙988 €
 EC max contribution 878˙988 € (100%)
 Programme 1. H2020-EU.1.3.1. (Fostering new skills by means of excellent initial training of researchers)
 Code Call H2020-MSCA-ITN-2019
 Funding Scheme MSCA-ITN-EID
 Starting year 2020
 Duration (year-month-day) from 2020-01-01   to  2023-12-31


Take a look of project's partnership.

# participants  country  role  EC contrib. [€] 
1    UNIVERSITY OF GLASGOW UK (GLASGOW) coordinator 336˙858.00
2    IBM RESEARCH GMBH CH (RUESCHLIKON) participant 343˙782.00
3    SYNOPSYS DENMARK APS DK (COPENHAGEN V) participant 198˙348.00


 Project objective

In semiconductor technology and applications today, we are increasingly observing a shift from the pure silicon CMOS technology towards hybridisation of function in terms of bringing in sensors, power, memory and photonics functionality on the same chip. In particular, there is a great interest in the heterogeneous and monolithic integration of III-V materials and other complex semiconductors, such as III-Nitrides and SiC on Si substrate. However, the direct growth of III-V materials on silicon inevitably will lead to crystal defects that significantly decreases performance of novel devices.

To overcome this main technological challenge and to make this new technology financially viable, the most cost-effective and time-effective approach is to combine experimental and simulation work, which indeed is the main aim on this project – DESING-EID. This will be achieved by addressing the following objectives.

The first objective of DESIGN-EID is to train three young ESRs who will bridge the gap between predictive simulations, experimental materials and device development by developing simulation tools for prediction of crystal growth as a function of process conditions. Secondly, completely eliminating defects in compound semiconductors is likely not achievable, therefore a simulation framework providing an accurate evaluation of their impact on device performance will be essential for designing devices and materials minimizing their impact. Furthermore, semiconductor defects in semiconductors may be exploited for their unique electronic properties if their presence and properties are controlled. For example, vacancies might be used to implement Qu-bits, whereas extended defects, such as dislocations, can provide unique transport properties. Hence, the last objective of the DESIGN-EID project focuses on experimental control and accurate simulation of the impact of defects on electronic and photonic device performance.


List of deliverables.
Supervisory Board of the network Other 2020-02-27 15:24:00

Take a look to the deliverables list in detail:  detailed list of DESIGN-EID deliverables.

Are you the coordinator (or a participant) of this project? Plaese send me more information about the "DESIGN-EID" project.

For instance: the website url (it has not provided by EU-opendata yet), the logo, a more detailed description of the project (in plain text as a rtf file or a word file), some pictures (as picture files, not embedded into any word file), twitter account, linkedin page, etc.

Send me an  email ( and I put them in your project's page as son as possible.

Thanks. And then put a link of this page into your project's website.

The information about "DESIGN-EID" are provided by the European Opendata Portal: CORDIS opendata.

More projects from the same programme (H2020-EU.1.3.1.)


Dementia: Intersectorial Strategy for Training and Innovation Network for Current Technology (DISTINCT)

Read More  

BIGMATH (2018)

Big Data Challenges for Mathematics

Read More  

POLISS (2019)

Policies for Smart Specialisation

Read More