FUNPROB
Functional semiconductor nanowire probes
| Coordinatore | UNIVERSITY OF DURHAM
Organization address
address: STOCKTON ROAD THE PALATINE CENTRE contact info |
| Nazionalità Coordinatore | United Kingdom [UK] |
| Totale costo | 374˙300 € |
| EC contributo | 374˙300 € |
| Programma | FP7-PEOPLE
Specific programme "People" implementing the Seventh Framework Programme of the European Community for research, technological development and demonstration activities (2007 to 2013) |
| Code Call | FP7-PEOPLE-2010-IRSES |
| Funding Scheme | MC-IRSES |
| Anno di inizio | 2011 |
| Periodo (anno-mese-giorno) | 2011-07-01 - 2015-06-30 |
Partecipanti
| # | ||||
|---|---|---|---|---|
| 1 |
UNIVERSITY OF DURHAM
Organization address
address: STOCKTON ROAD THE PALATINE CENTRE contact info |
UK (DURHAM) | coordinator | 95˙000.00 |
| 2 |
AALTO-KORKEAKOULUSAATIO
Organization address
address: OTAKAARI 1 contact info |
FI (ESPOO) | participant | 64˙600.00 |
| 3 |
UNIVERSITE PARIS-SUD
Organization address
address: RUE GEORGES CLEMENCEAU 15 contact info |
FR (ORSAY) | participant | 58˙900.00 |
| 4 |
UNIVERZITA KARLOVA V PRAZE
Organization address
address: Ovocny trh 5 contact info |
CZ (PRAHA 1) | participant | 57˙000.00 |
| 5 |
LANCASTER UNIVERSITY
Organization address
address: BAILRIGG contact info |
UK (LANCASTER) | participant | 55˙100.00 |
| 6 |
UNIVERSITE BLAISE PASCAL CLERMONT-FERRAND II
Organization address
address: 34 Avenue Carnot contact info |
FR (CLERMONT-FERRAND) | participant | 43˙700.00 |
Mappa
Word cloud
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Obiettivo del progetto (Objective)
'Scanning probe microscopy (SPM) is an established technique for the characterisation of materials and structures at the nanoscale and is increasingly bridging traditional disciplines including the biosciences. As such, it is of fundamental and practical interest across the sciences and industry. The geometry of the tip is the critical factor which determines the resolution of an SPM sensor. In an attempt to achieve ultra high spatial resolution, carbon nanotubes have been widely investigated and shown some promise. However, it is extremely difficult to control the properties of these tubes, especially the electrical behaviour and growth geometry. Equally, their manipulation is a daunting task. We propose to use III-V semiconductor nanowires as functioning sensors at the apex of scanning probes. These structures can be directly grown on the substrates or SPM cantilevers with controllable properties at the nanometre scale. Using these nanowires offers excellent new avenues for the integration of established semiconducting devices onto the tip of a scanning probe. This will improve the sensitivity and functionality of scanning probe methods. An example of potential applications for such a novel probe is the detection of virus based on their electrical response which can be coupled to that of nanowires under appropriate conditions. Within the framework of this project, we will combine the complementary expertise of various internationally leading institutions for the creation of integrated individual semiconductor nanowire SPM probes exhibiting enhanced functionalities.'
Introduzione (Teaser)
Scanning probe microscopy (SPM) is used for the characterisation of materials and structures at the nano-scale level. Issues with controlling SPM sensor tip geometry and properties affect spatial resolution and performance.