FUNPROB

Functional semiconductor nanowire probes

 Coordinatore UNIVERSITY OF DURHAM 

 Organization address address: STOCKTON ROAD THE PALATINE CENTRE
city: DURHAM
postcode: DH1 3LE

contact info
Titolo: Ms.
Nome: Wendy
Cognome: Harle
Email: send email
Telefono: +44 191 3344635
Fax: +44 191 3344634

 Nazionalità Coordinatore United Kingdom [UK]
 Totale costo 374˙300 €
 EC contributo 374˙300 €
 Programma FP7-PEOPLE
Specific programme "People" implementing the Seventh Framework Programme of the European Community for research, technological development and demonstration activities (2007 to 2013)
 Code Call FP7-PEOPLE-2010-IRSES
 Funding Scheme MC-IRSES
 Anno di inizio 2011
 Periodo (anno-mese-giorno) 2011-07-01   -   2015-06-30

 Partecipanti

# participant  country  role  EC contrib. [€] 
1    UNIVERSITY OF DURHAM

 Organization address address: STOCKTON ROAD THE PALATINE CENTRE
city: DURHAM
postcode: DH1 3LE

contact info
Titolo: Ms.
Nome: Wendy
Cognome: Harle
Email: send email
Telefono: +44 191 3344635
Fax: +44 191 3344634

UK (DURHAM) coordinator 95˙000.00
2    AALTO-KORKEAKOULUSAATIO

 Organization address address: OTAKAARI 1
city: ESPOO
postcode: 2150

contact info
Titolo: Prof.
Nome: Harri Kalevi
Cognome: Lipsanen
Email: send email
Telefono: +358 9 47023123
Fax: +358 9 47023128

FI (ESPOO) participant 64˙600.00
3    UNIVERSITE PARIS-SUD

 Organization address address: RUE GEORGES CLEMENCEAU 15
city: ORSAY
postcode: 91405

contact info
Titolo: Mr.
Nome: Nicolas
Cognome: Lecompte
Email: send email
Telefono: 33169155589
Fax: 33169155599

FR (ORSAY) participant 58˙900.00
4    UNIVERZITA KARLOVA V PRAZE

 Organization address address: Ovocny trh 5
city: PRAHA 1
postcode: 11636

contact info
Titolo: Prof.
Nome: Vladimir
Cognome: Matolin
Email: send email
Telefono: 420222000000
Fax: 420283000000

CZ (PRAHA 1) participant 57˙000.00
5    LANCASTER UNIVERSITY

 Organization address address: BAILRIGG
city: LANCASTER
postcode: LA1 4YW

contact info
Titolo: Ms.
Nome: Taylor
Cognome: Sarah
Email: send email
Telefono: +44 1524 592734
Fax: +44 1524 844087

UK (LANCASTER) participant 55˙100.00
6    UNIVERSITE BLAISE PASCAL CLERMONT-FERRAND II

 Organization address address: 34 Avenue Carnot
city: CLERMONT-FERRAND
postcode: 63006

contact info
Titolo: Prof.
Nome: Jean
Cognome: Buffier
Email: send email
Telefono: +334 73 40 52 37
Fax: +33 4 73 40 64 31

FR (CLERMONT-FERRAND) participant 43˙700.00

Mappa


 Word cloud

Esplora la "nuvola delle parole (Word Cloud) per avere un'idea di massima del progetto.

materials    microscopy    resolution    spm    probe    spatial    probes    semiconductor    structures    nanowires    tip    characterisation    sensor    scanning    electrical    geometry   

 Obiettivo del progetto (Objective)

'Scanning probe microscopy (SPM) is an established technique for the characterisation of materials and structures at the nanoscale and is increasingly bridging traditional disciplines including the biosciences. As such, it is of fundamental and practical interest across the sciences and industry. The geometry of the tip is the critical factor which determines the resolution of an SPM sensor. In an attempt to achieve ultra high spatial resolution, carbon nanotubes have been widely investigated and shown some promise. However, it is extremely difficult to control the properties of these tubes, especially the electrical behaviour and growth geometry. Equally, their manipulation is a daunting task. We propose to use III-V semiconductor nanowires as functioning sensors at the apex of scanning probes. These structures can be directly grown on the substrates or SPM cantilevers with controllable properties at the nanometre scale. Using these nanowires offers excellent new avenues for the integration of established semiconducting devices onto the tip of a scanning probe. This will improve the sensitivity and functionality of scanning probe methods. An example of potential applications for such a novel probe is the detection of virus based on their electrical response which can be coupled to that of nanowires under appropriate conditions. Within the framework of this project, we will combine the complementary expertise of various internationally leading institutions for the creation of integrated individual semiconductor nanowire SPM probes exhibiting enhanced functionalities.'

Introduzione (Teaser)

Scanning probe microscopy (SPM) is used for the characterisation of materials and structures at the nano-scale level. Issues with controlling SPM sensor tip geometry and properties affect spatial resolution and performance.

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