SNOW CONTROL

Integrated Real-Time Measurement Platforms for Nanoparticles and Nanoparticle Thin Films

 Coordinatore KATHOLIEKE UNIVERSITEIT LEUVEN 

 Organization address address: Oude Markt 13
city: LEUVEN
postcode: 3000

contact info
Titolo: Ms.
Nome: Tine
Cognome: Heylen
Email: send email
Telefono: +32 16 32 65 20
Fax: +32 16 32 65 15

 Nazionalità Coordinatore Belgium [BE]
 Sito del progetto http://fys.kuleuven.be/vsm/snowcontrol/
 Totale costo 4˙247˙139 €
 EC contributo 2˙820˙000 €
 Programma FP7-NMP
Specific Programme "Cooperation": Nanosciences, Nanotechnologies, Materials and new Production Technologies
 Code Call FP7-NMP-2010-SME-4
 Funding Scheme CP-TP
 Anno di inizio 2011
 Periodo (anno-mese-giorno) 2011-06-14   -   2015-06-13

 Partecipanti

# participant  country  role  EC contrib. [€] 
1    KATHOLIEKE UNIVERSITEIT LEUVEN

 Organization address address: Oude Markt 13
city: LEUVEN
postcode: 3000

contact info
Titolo: Ms.
Nome: Tine
Cognome: Heylen
Email: send email
Telefono: +32 16 32 65 20
Fax: +32 16 32 65 15

BE (LEUVEN) coordinator 932˙436.00
2    BRUKER AXS GMBH

 Organization address address: OSTLICHE RHEINBRUCKENSTRASSE 49
city: KARLSRUHE
postcode: 76187

contact info
Titolo: Dr.
Nome: Lutz
Cognome: Bruegemann
Email: send email
Telefono: +49 721 595 4307
Fax: +49 721 595 6693

DE (KARLSRUHE) participant 618˙805.00
3    CORDOUAN TECHNOLOGIES SAS

 Organization address address: "CITE DE LA PHOTONIQUE, AVENUE DE CANTERANNE 11"
city: PESSAC
postcode: 33600

contact info
Titolo: Dr.
Nome: Stephane
Cognome: Ait Oumeghar
Email: send email
Telefono: +33 556 425 288
Fax: +33 547 747 491

FR (PESSAC) participant 437˙773.80
4    DCA-INSTRUMENTS OY

 Organization address address: VAJOSSUONKATU 8
city: TURKU
postcode: 20360

contact info
Titolo: Dr.
Nome: Lasse
Cognome: Salminen
Email: send email
Telefono: +358 2 2382 500
Fax: +358 2 2388 993

FI (TURKU) participant 415˙800.00
5    KEMSTREAM SAS

 Organization address address: "RUE DE LA VIELLE POSTE, PIT DE LA POMPIGNANE T2"
city: MONTPELLIER
postcode: 34055

contact info
Titolo: Mr.
Nome: Herve
Cognome: Guillon
Email: send email
Telefono: +33 4 67 20 04 10
Fax: +33 467 200 411

FR (MONTPELLIER) participant 215˙699.70
6    IBM RESEARCH GMBH

 Organization address address: SAEUMERSTRASSE 4
city: RUESCHLIKON
postcode: 8803

contact info
Titolo: Ms.
Nome: Catherine
Cognome: Trachsel
Email: send email
Telefono: +41 44 724 8289
Fax: +41 44 724 8578

CH (RUESCHLIKON) participant 199˙485.50

Mappa


 Word cloud

Esplora la "nuvola delle parole (Word Cloud) per avere un'idea di massima del progetto.

ray    metrology    angle    successfully    snow    zeta    time    dls    line    spheres    characterise    first    size    characterization    automated    rheed    scattering    uses    films    saxs    dynamic    electron    np    thin    diffraction    techniques    deposition    shape    real    vacuum    small    platform    platforms    zp    ultraviolet    tools    standard    simultaneous    monitor    nps    light    nanoparticles       reflection    energy    flux   

 Obiettivo del progetto (Objective)

'One of the major barriers towards the successful introduction of nanoparticles (NP) into many applications is the lack of a tight control on their properties ((size, shape, crystallinity, composition, core-shell, functionalization, etc). This can only be resolved by the simultaneous use of several metrology methods, to extract the relevant information in real-time and to establish of a feedback control loop. In this project we take the first steps towards this goal by proposing the required concepts and methods.

The main goal of this project is therefore to develop real-time characterization metrology tools to measure the properties of nanoparticles, functionalized NPs and NP thin films. To enable a real-time and a complete characterization of NP properties we drastically extend the capabilities of Dynamic Light Scattering (DLS), Zeta Potential (ZP) and Small Angle X-ray Scattering (SAXS) and combine those into an integrated real-time NPs measurement platform.

New methods to measure the flux of NPs in the gas phase and the properties of NP thin films and heterostructures will be developed based on ultraviolet and vacuum ultraviolet radiation. These will be combined with Grazing Incidence SAXS and Reflection High Energy Electron Diffraction into a real-time NP thin film measurement platform.

Standard operating procedures will be developed for these instrument combinations so that a multi-method metrology standard can be defined based on the (quasi-) simultaneous measurement of complimentary properties with the different tools.

Finally, the capabilities of these integrated measurement platforms will be tested against two high throughput lines for the production of NP in solution and for the growth of NP thin films.

This project will be carried out by four Small and Medium Enterprises -- all active in equipment and metrology development -- two Industrial partners and two institutes for Higher and Secondary Education.'

Introduzione (Teaser)

New in-line and real-time automated measurement techniques to characterise nanoparticles (NPs) and NP-based thin films during production promise to revolutionise materials and devices.

Descrizione progetto (Article)

Nanomaterials consisting of substances with dimensions on the scale of molecules are revolutionising devices in fields from medical technology to communications and energy. Shapes of NPs include simple spheres, hollow or layered spheres and rice-shaped particles. Their shape and size play a critical role in function yet there are no comprehensive real-time techniques for accurate measurement.

The EU-funded project 'Integrated real-time measurement platforms for nanoparticles and nanoparticle thin films' (SNOW CONTROL) has made major advances to deliver revolutionary automated and real-time characterisation of NPs and NP-based films during synthesis. The systems developed will be the first available worldwide with such capabilities, ensuring immediate commercial interest. Scientists focused on three existing measurement techniques: dynamic light scattering or DLS, zeta potential or ZP (a dispersion measure) and small angle X-ray scattering or SAXS.

The first platform, directed at NPs, uses DLS, ZP and SAXS to automatically characterise NPs of a selected size. Partners developed a remote DLS probe head to facilitate combining techniques. They delivered a completely new SAXS system to generate three to four times higher X-ray flux relative to other available lab sources. Optoelectronics in the form of classical electrophoresis enabled improved ZP measurement capability. The prototype enhanced measurement resolution and accuracy by a factor of three to 10 versus existing solutions. The real-time DLS and SAXS techniques were integrated into a flow-chemistry line to successfully measure the evolution of NP size.

The second platform uses in-line ultraviolet flux sensing and reflection high-energy electron diffraction (RHEED) to analyse and monitor vacuum deposition of NP thin films. Partners redesigned an existing liquid injection/vaporisation unit that was then integrated into the vacuum deposition system with the RHEED and the laser-based NP flux monitor. The platform has already been used to successfully grow NP thin films.

SNOW CONTROL has developed two real-time measurement platforms for automated NP production cycles. Automated control is a necessary but currently missing link in the production chain. Standardised, repeatable and robust NP quality will facilitate their optimal performance in many applications ranging from biomedical drug release to electronic devices.

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