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SemI40 SIGNED

Power Semiconductor and Electronics Manufacturing 4.0

Total Cost €

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EC-Contrib. €

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Partnership

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 SemI40 project word cloud

Explore the words cloud of the SemI40 project. It provides you a very rough idea of what is the project "SemI40" about.

big    positioned    flexibility    decision    total    transparency    chain    action    planning    powered    assembly    vertical    participating    automation    advancing    sustainable    addressing    consists    facilities    300    electronics    industrial    considering    spans    competitiveness    covered    2020    horizontal    agile    erp    skills    establishing    electronic    critical    line    distributed    holistic    pilot    fab    safeguard    enhanced    semiconductor    material    masp2015    raw    supply    microelectronics    representing    lines    economic    worldwide    maintenance    virtualization    actions    oriented    jobs    trl    countries    manufacturing    digitalization    technologies    domains    contributes    serving    innovative    society    innovation    37    responds    made    pave    internet    data    balancing    resource    environment    policies    people    solutions    semi40    employed    components    expertise    ambition    industry    ecs    power    security    urgent    smart    enterprise    social    markets   

Project "SemI40" data sheet

The following table provides information about the project.

Coordinator
INFINEON TECHNOLOGIES AUSTRIA AG 

Organization address
address: SIEMENSSTRASSE 2
city: VILLACH
postcode: 9500
website: www.infineon.com/austria

contact info
title: n.a.
name: n.a.
surname: n.a.
function: n.a.
email: n.a.
telephone: n.a.
fax: n.a.

 Coordinator Country Austria [AT]
 Project website http://www.semi40.eu/
 Total cost 61˙919˙643 €
 EC max contribution 12˙227˙386 € (20%)
 Programme 1. H2020-EU.2.1.1.7. (ECSEL)
 Code Call H2020-ECSEL-2015-2-IA-two-stage
 Funding Scheme ECSEL-IA
 Starting year 2016
 Duration (year-month-day) from 2016-05-01   to  2019-04-30

 Partnership

Take a look of project's partnership.

# participants  country  role  EC contrib. [€] 
1    INFINEON TECHNOLOGIES AUSTRIA AG AT (VILLACH) coordinator 1˙204˙537.00
2    INFINEON TECHNOLOGIES AG DE (NEUBIBERG) participant 1˙738˙467.00
3    INFINEON TECHNOLOGIES DRESDEN GMBH& CO KG DE (DRESDEN) participant 1˙244˙362.00
4    SEMIKRON ELEKTRONIK GMBH & CO. KG DE (NURNBERG) participant 598˙837.00
5    AIT AUSTRIAN INSTITUTE OF TECHNOLOGY GMBH AT (WIEN) participant 482˙126.00
6    ION BEAM SERVICES FR (ROUSSET) participant 480˙727.00
7    ELMOS Semiconductor AG DE (Dortmund) participant 464˙948.00
8    ROBERT BOSCH GMBH DE (GERLINGEN-SCHILLERHOEHE) participant 450˙399.00
9    KNOW-CENTER GMBH RESEARCH CENTER FOR DATA-DRIVEN BUSINESS & BIG DATA ANALYTICS AT (GRAZ) participant 405˙000.00
10    TECHNISCHE UNIVERSITAET DRESDEN DE (DRESDEN) participant 382˙501.00
11    TECHNISCHE UNIVERSITAET WIEN AT (WIEN) participant 365˙712.00
12    VIRTUAL VEHICLE RESEARCH GMBH AT (GRAZ) participant 318˙834.00
13    AT & S AUSTRIA TECHNOLOGIE & SYSTEMTECHNIK AKTIENGESELLSCHAFT AT (LEOBEN) participant 309˙099.00
14    AVL LIST GMBH AT (GRAZ) participant 283˙862.00
15    FABMATICS GMBH DE (DRESDEN) participant 275˙000.00
16    INFINEON TECHNOLOGIES IT-SERVICES GMBH AT (KLAGENFURT) participant 261˙105.00
17    SYSTEMA SYSTEMENTWICKLUNG DIPL INF.MANFRED AUSTEN GMBH DE (DRESDEN) participant 231˙250.00
18    Fraunhofer Austria Research GmbH AT (Vienna) participant 222˙635.00
19    SCHILLER AUTOMATISIERUNGSTECHNIK GMBH DE (OSTERHOFEN) participant 205˙314.00
20    UNIVERSITAET KLAGENFURT AT (KLAGENFURT) participant 201˙172.00
21    PLANSEE SE AT (REUTTE) participant 185˙915.00
22    FACHHOCHSCHULE BURGENLAND GMBH AT (EISENSTADT) participant 175˙701.00
23    UNIVERSITA DEGLI STUDI DI PAVIA IT (PAVIA) participant 169˙999.00
24    INSTITUT FUER AUTOMATION UND KOMMUNIKATION E.V. MAGDEBURG DE (MAGDEBURG) participant 157˙218.00
25    FRAUNHOFER GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. DE (MUNCHEN) participant 138˙460.00
26    MATERIALS CENTER LEOBEN FORSCHUNG GMBH AT (LEOBEN) participant 135˙650.00
27    ZNT ZENTREN FUR NEUE TECHNOLOGIEN GMBH DE (GRUNWALD) participant 131˙582.00
28    POLITECNICO DI MILANO IT (MILANO) participant 129˙688.00
29    INSTITUTO DE TELECOMUNICACOES PT (GLORIA E VERA CRUZ) participant 119˙750.00
30    METRALABS GMBH NEUE TECHNOLOGIEN UND SYSTEME DE (ILMENAU) participant 118˙612.00
31    UNIVERSIDADE DE AVEIRO PT (AVEIRO) participant 113˙750.00
32    L.P.E. SPA IT (BARANZATE MILANO) participant 110˙781.00
33    HOCHSCHULE MITTWEIDA (FH) DE (MITTWEIDA) participant 108˙014.00
34    KAI KOMPETENZZENTRUM AUTOMOBIL - UND INDUSTRIEELEKTRONIK GMBH AT (VILLACH ST MAGDALEN) participant 93˙559.00
35    ATEP - AMKOR TECHNOLOGY PORTUGAL SA PT (MINDELO VILA DO CONDE) participant 83˙437.00
36    CRITICAL MANUFACTURING SA PT (MOREIRA DA MAIA PORTO) participant 74˙375.00
37    PLASMETREX GMBH DE (BERLIN) participant 55˙000.00
38    ROTH & RAU - ORTNER GMBH DE (DRESDEN) participant 0.00

Map

 Project objective

Addressing European Policies for 2020 and beyond the “Power Semiconductor and Electronics Manufacturing 4.0” (SemI40) project responds to the urgent need of increasing the competitiveness of the Semiconductor manufacturing industry in Europe through establishing smart, sustainable, and integrated ECS manufacturing. SemI40 will further pave the way for serving highly innovative electronic markets with products powered by microelectronics “Made in Europe”. Positioned as an Innovation Action it is the high ambition of SemI40 to implement technical solutions on TRL level 4-8 into the pilot lines of the industry partners. Challenging use cases will be implemented in real manufacturing environment considering also their technical, social and economic impact to the society, future working conditions and skills needed. Applying “Industry 4.0”, “Big Data”, and “Industrial Internet” technologies in the electronics field requires holistic and complex actions. The selected main objectives of SemI40 covered by the MASP2015 are: balancing system security and production flexibility, increase information transparency between fields and enterprise resource planning (ERP), manage critical knowledge for improved decision making and maintenance, improve fab digitalization and virtualization, and enable automation systems for agile distributed production. SemI40’s value chain oriented consortium consists of 37 project partners from 5 European countries. SemI40 involves a vertical and horizontal supply chain and spans expertise and partners from raw material research, process and assembly innovation and pilot line, up to various application domains representing enhanced smart systems. Through advancing manufacturing of electronic components and systems, SemI40 contributes to safeguard more than 20.000 jobs of people directly employed in the participating facilities, and in total more than 300.000 jobs of people employed at all industry partners’ facilities worldwide.

 Publications

year authors and title journal last update
List of publications.
2018 Ani Bicaku
Security Compliance Verification in Cyber Physical Systems
published pages: , ISSN: , DOI:
2020-04-23
2019 Anja Zernig, Ashwini Pandeshwar
Machine Learning and Automated Decision Making
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Ani Bicaku, Christoph Schmittner, Patrick Rottmann, Markus Tauber, Jerker Delsnig
Security Safety and Organizational Standard Compliance in CPS
published pages: , ISSN: , DOI:
Issue in Infocommunications Journal XI(I):2 2020-04-23
2019 Ani Bicaku, Markus Tauber, Christoph Schmittner
Continuous Compliance in Cyber Physical Systems
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Bernat Zaragoza Travieso, Christoph Gaisberger, Manfred Mücke, Matthias Fehr
On-Line Screening of a Chemical-Machine Wafer Cleaning Process Based on Ordinal Measure
published pages: , ISSN: , DOI:
2020-04-23
2019 Rainer Matischek and Benjamin Bara
Application Study of Hardware-Based Security for Future Industrial IOT
published pages: , ISSN: , DOI:
2020-04-23
2019 David Wittwer, Sebastian Rank, Thorsten Schmidt
Impact of Test Wafers in the Transportation System of a Semiconductor Factory
published pages: , ISSN: , DOI:
2020-04-23
2019 Gerhard Luhn, Johaness Postel, Lutz Muche, Philipp Kopp, Germar Schneider
You want to close the gap between exploding amounts of data, while enabling the rise of your globalized real time enterprise?
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann
On-the-fly camera software solution for automatic perspective recognition of structured surfaces
published pages: , ISSN: , DOI:
2020-04-23
2019 Bernhard Geiger, Stefan Schrunner, Roman Kern
An Information-Theoretic Measure for Pattern Similarity in Analog Wafermaps
published pages: , ISSN: , DOI:
2020-04-23
2018 Igor Stogniy, Wolfgang Scholl
The granularity of the automated-generated long-term simulation model
published pages: , ISSN: , DOI:
2020-04-23
2018 Andreas Felsberger, Gerald Reiner
How to measure the digital transformation along industrial value chains? Cases of the semiconductor industry
published pages: , ISSN: , DOI:
2020-04-23
2019 Manfred Mücke
Die große Wirkung der kleinsten Teile
published pages: , ISSN: , DOI:
2020-04-23
2019 Andreas Felsberger, Christian Wankmüller, Gerald Reiner, Alexander Stocker, Gernot Lechner, Marius Lütkemeyr, Alessandro Sala
Current state of digitalization in the European Electronic Components and Systems Industry: A multiple-case study analysis
published pages: , ISSN: , DOI:
2020-04-23
2018 Andreas Lausegger (UNI-KLU)
Statistische Prozesskontrolle als Entscheidungshilfe und Kontrollmethode für die Produktionsprogrammplanung in der Halbleiterindustrie
published pages: , ISSN: , DOI:
2020-04-23
2018 Federica Acerbi; Giuseppe De Nicolao; Josef Obiltschnig; Patrick Richter; Cristina de Luca
Accuracy and robustness against covariate shift of water chiller models
published pages: , ISSN: , DOI:
2020-04-23
2019 Andreas Felsberger, Bernhard Oberegger, Christian Wankmüller, Gernot Lechner, Gerald Reiner
The impact of digital technologies on manufacturing performance: A simulation modelling approach
published pages: , ISSN: , DOI:
2020-04-23
2019 Karli Hatzschmann, Germar Schneider
\"Tasks and Results of Work Package \"\"Swarm Intelligence\"\"\"
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Manfred Rosenberger, Alexander Stocker
Capturing Industry 4.0 Use Cases for interdisciplinary implementation teams
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Andreas Felsberger, Christian Wankmüller, Bernhard Oberegger, Gernot Lechner, Gerald Reiner
An analysis of improvement potentials and impacts of digitalization on manufacturing performance
published pages: , ISSN: , DOI:
2020-04-23
2019 Anja Zernig, Stefan Schrunner, Martin Pleschberger, Michael Scheiber, Anna Jenul, Andre Kästner
Machine Learning Techniques for Automated Wafer Assessment using Wafer Test Data
published pages: , ISSN: , DOI:
2020-04-23
2019 Benjamin Bara
Design and Implementation of IIoT Demonstrators using Hardware Security Extensions
published pages: , ISSN: , DOI:
2020-04-23
2019 Germar Schneider, Thomas Wagner, Sebastian Rank, Frank Schulze
Key elements of productivity enhancement in semiconductor manufacturing usig digitalization and fab simulation
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Rene Kaiser
Knowledge Protection Practices in a Data-Centric Collaborative Research and Innovation Project
published pages: , ISSN: , DOI:
2020-04-23
2019 Federica Acerbi, Giuseppe De Nicolao, Josef Obiltschnig, Patrick Richter, Cristina De Luca
Robustness against Covariate Shift of Water Chiller Models for Optimal Energy Management in a SM plant
published pages: , ISSN: , DOI:
2020-04-23
2018 Firooz B. Saghezchi, Georgios Mantas, Alireza Esfahani, Hassan Alizadeh, Joaquim Bastos, Jonathan Rodriguez
Machine Learning to Automate Network Segregation for Enhanced Secuirty in Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2018 Sebastian Rank
SemI40 - Simulationsmodelle in der Halbleiterindustrie: Modellierung so detailliert wie nötig und so einfach wie möglich
published pages: , ISSN: , DOI:
2020-04-23
2019 Dennis Bauer, Andreas Schlereth, Florian Maier, Thomas Ponsignon, Bernd Waschneck
Automated Framework to Influence Production Dispatch Based on Supply Chain Events
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2018 Igor Stogniy, Wolfgang Scholl
The granularity of the automated-generated long-term simulation model
published pages: , ISSN: , DOI:
2020-04-23
2018 Germar Schneider, Sophia Keil, Gerhard Luhn
Oppurtinities, Challenges and Use Cases of Digitization iwthin the Semiconductor Industry
published pages: , ISSN: , DOI:
Proceedings ASMC 2018 2020-04-23
2018 Germar Schneider, Wolfgang Scholl
User Day Systema - Status Infineon Technologies Dresden
published pages: , ISSN: , DOI:
2020-04-23
2018 Anic Bicaku, Christoph Schmittner, Markus Tauber, Jerker Delsing
Monitoring Industry 4.0 Applications for Security and Safety Standard Compliance
published pages: , ISSN: , DOI:
Proceedings ICPS2018 - 1st IEEE Interrnational Conference on Industrial Cyber-Physical Systems 2020-04-23
2018 Germar Schneider, S. Keil, G Luhn
Opportunities, Challenges and Use Cases of Digitization within the Semiconductor Industry
published pages: , ISSN: , DOI:
2020-04-23
2019 Frederic Ringsleben and Thomas Haenselmann
Video-Supported real-time analysis of products and manufacturing processes
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Firooz B. Saghezchi, Georgios Mantas, Alireza Esfahani, Joaquim Bastos, Jonatahn Rodriguez
Machine Learning for Network-based Intrusion Detection in Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2019 Mario Cordeiro, Nuno Vitorino, Pedro Gama, Joao Cortez, Augusto Vilarinho
MES Challenges
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Lukas Lingitz, Vciola Gallin, Pedro Vasconceles
Cycle Time Prediction with Machine Learning in the Wafer Production
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Thomas Wagner, Germar Schneider
A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2018 Ani Bicaku, Markus Tauber, Christoph Schmittner
Continuous Standard Compliance Verification in SemI40
published pages: , ISSN: , DOI:
2020-04-23
2019 Markus Tauber, Ani Bicaku
Continous Security Compliance Verfication in Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2019 Alireza Esfahani, Georgios Mantas, Firooz B. Saghezchi, Joaquim Bastos, Jonathan Rodriguez
Cybersecurity Attacks in Semiconductor Supply Chain Environment
published pages: , ISSN: , DOI:
2020-04-23
2019 Andreas Felsberger, Gerald Reiner, Marius Lütkemeyer, Alessandro Sala, Alexander Stocker, Gernot Lechner
An impact evaluation approach for smart factory cases
published pages: , ISSN: , DOI:
2020-04-23
2019 Alessio Mosca, Cristina De Luca, Davide Raimondo
A Scalable Wafer Dispatching Strategy Based on Dynamic Programming
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2018 Markus Tauber
Continuous Security Compliance Verification in Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2019 Rene Kaiser, Stefan Thalmann, Viktoria Pammer-Schindler, Angela Fessl
Collaborating in a Research and Development Project: Knowledge Protection Practices applied in a Co-opetitive Setting
published pages: , ISSN: , DOI:
2020-04-23
2019 Alessandro Sala, Marius Lütkemeyer, Andreas Felsberger
Semiconductor Research Roadmap
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2018 Igor Stogniy, Wolfgang Scholl
An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry
published pages: , ISSN: , DOI:
2020-04-23
2018 Sarah Haas, Thoams ULZ, Christian Steger
Secured Action Authorization for Industrial Mobile Robots
published pages: , ISSN: , DOI:
2020-04-23
2018 Peter Tulala, Hamidreza Mahyar, Elahe Ghalebi, Radu Grosu
Unsupervised Wafermap Patterns Clustering via Variational Autoencoders
published pages: , ISSN: , DOI:
AMSC Proceedings 2020-04-23
2018 Stefan Schrunner, Olivia Bluder, Andre Kästner, Roman Kern
A comparison of Supervised Approaches for Process Pattern Recognition in Analog Semiconductor Wafer Test Data
published pages: , ISSN: , DOI:
2020-04-23
2018 Romana Boiger, Gerfried Millner, Manfred Mücke, Bernat Zaragoza Travieso
Towards Robust Visual Wafer Cleaning Anomaly Detection
published pages: , ISSN: , DOI:
2020-04-23
2018 Firooz B. Saghezchi, Georgios Mantas , Alireza Esfahani, Hassan Alizadeh, Joaquim Bastos and Jonathan Rodriguez
Machine Learning to Automate Network Segregation for Enhanced Secuirty in Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2018 Anja Zernig
Investigation of multi-run Independent Component Analysis on simulated semiconductor data
published pages: , ISSN: , DOI:
2020-04-23
2018 Germar Schneider, Thomas Wagner, Jens Naake, Sebastian Rank, Frank Schulze
Fab Simulation and Virtualization - The Key to Enhance the Fab Performance within the Semiconductor Industry
published pages: , ISSN: , DOI:
2020-04-23
2018 Abdelkader Shaaban, Erwin Kristen, Christoph Schmittner (AIT)
Application of IEC 62443 for IoT Components
published pages: , ISSN: , DOI:
2020-04-23
2019 Andreas Felsberger, Christian Wankmüller, Bernhard Oberegger, Gernot Lechner, Gerald Reiner
An analysis of improvement potentials and impacts of digitalization on manufacturing performance
published pages: , ISSN: , DOI:
2020-04-23
2019 Felix Kamhuber (FHA), Alessandro Chiancone (KNOW)
Machine Learning algorithms for advanced process control in the semiconductor industry
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Alessandro Sala, Marius Lütkemeyer, Andreas Felsberger
Semiconductor Research Roadmap
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Alexander Aschauer, Florian Rötzer, Andreas Steinboeck, Andreas Kugi, Michael Eidenberger-Schober, Gernot Reichl
Job-shop scheduling with optimal inclusion of work-free night shifts
published pages: , ISSN: , DOI:
2020-04-23
2019 Tiago Santos, Stefan Schrunner, Bernhard C. Geiger, Olivia Pfeiler, Anja Zernig, Andre Kaestner, Roman Kern
Feature Extraction From Analog Wafermaps: A Comparison of Classical Image Processing and a Deep Generative Model
published pages: 190-198, ISSN: 0894-6507, DOI: 10.1109/tsm.2019.2911061
IEEE Transactions on Semiconductor Manufacturing 32/2 2020-04-23
2019 Mario Thron, Thomas Bangemann, Silia Maksuti, Ani Bicaku, Markus Tauber
Application of the CPPS meta-model for implementation of Industrie 4.0 Administration Shells
published pages: , ISSN: , DOI:
2020-04-23
2018 Darko Stanislavjevic, Manfred Rosenberger, Gernot Lechner, Stefan Körner, Roman Kern, Bernd Jeitler, Alexander Stocker
Ein Industrie 4.0 Use Case in der Motorenproduktion
published pages: , ISSN: , DOI:
2020-04-23
2018 Ani Bicaku
Enabling Standard Compliance in Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2019 Federica Acerbi, Giuseppe De Nicolao
Identification of chiller models for HVAC Management: Classical VS Machine Learning Techniques
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Igor Stogniy, Wolfgang Scholl
Automated-generated long term Simulation model in semiconductor manufacturing
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2018 Patrick Rottmann
Monitoring and Standards Compliant Measurements in Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2019 Dennis Bauer, Andreas Schlereth, Thomas Bauernhansl
Systemdynamik-Ansätze zur Optimierung der PPS
published pages: , ISSN: , DOI:
2020-04-23
2019 Yvonne Bergmann, Alexander Grosser
Photoresist Dispense Detection
published pages: , ISSN: , DOI:
2020-04-23
2018 Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann
Bestimmung von Objektparametern aus industriellen Bildern mit neuronalen Netzwerken
published pages: , ISSN: , DOI:
2020-04-23
2019 Karli Hatzschmann, Germar Schneider
\"Tasks and Results of Work Package \"\"Swarm Intelligence\"\"\"
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Alireza Esfahani, Georgios Mantas, Jose Ribeiro, Joaquim Bastos, Shahid Mumtaz, Manuel A. Violas, A. Manuel De Oliveira Duarte, Jonathan Rodriguez
An Efficient Web Authentication Mechanism Preventing Man-In-The-Middle Attacks in Industry 4.0 Supply Chain
published pages: 58981-58989, ISSN: 2169-3536, DOI: 10.1109/access.2019.2914454
IEEE Access 7 2020-04-23
2019 Bernat Zaragoza Travieso, Manfred Mücke, Matthias Fehr
Generic on-line video anomaly detection for cmp wafer cleaning
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Andreas Feustel, Mike Schneider
Networking the APC-Systems into a Fab Software Landscape
published pages: , ISSN: , DOI:
2020-04-23
2019 Anna Jenul (Student), Jürgen Pilz (Supervisor UNI-KLU)
Intensity Quanitification of Process Patterns in Wafer Test Data
published pages: , ISSN: , DOI:
2020-04-23
2018 Dennis Bauer, Andreas Schlereth, Florian Maier
Simulation-assisted decision making for supply chain disruptions in production control
published pages: , ISSN: , DOI:
2020-04-23
2018 Markus Tauber, Christoph Schmittner
Enabling Security and Safety Evaluation in Industry 4.0 Use cases with Digital Twins
published pages: , ISSN: , DOI:
Special Issue ERCIM News 115 2020-04-23
2019 Andreas Felsberger, Christian Wankmüller, Gerald Reiner, Alexander Stocker, Gernot Lechner, Marius Lütkemeyr, Alessandro Sala
Current state of digitalization in the European Electronic Components and Systems Industry: A multiple-case study analysis
published pages: , ISSN: , DOI:
2020-04-23
2018 Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann, Romana Boiger, Manfred Muecke, Matthias Fehr, Dirk Motthes
A new approach using characteristic video singals to improve the stability of manufacturing processes
published pages: , ISSN: , DOI:
2020-04-23
2018 Rene Kaiser
Towards Applying the Virtual Director Concept to 360 Degree Video Content
published pages: , ISSN: , DOI:
2020-04-23
2018 Andreas Schlereth
Aufbau eines Modells zur ereignisgetriebenen Produktionssteuerung
published pages: , ISSN: , DOI:
2020-04-23
2018 Lukas Lingitz, Viola Gallina, Fazel Ansari, David Gyulai (external), Andras Pfeiffer (external), Wilfried Sihn
Lead time prediction using machine learning algorithms: A case study by a semiconductor manufacturer
published pages: , ISSN: , DOI:
Proceedings of the 51st CIRP Conference on Manufacturing Systems (CIRP CMS 2018) 2020-04-23
2019 Gerhard Luhn, Johaness Postel, Lutz Muche, Philipp Kopp, Germar Schneider
You want to close the gap between exploding amounts of data, while enabling the rise of your globalized real time enterprise?
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Andreas Schlereth; Thomas Ponsignon, Axel Bruns, Dennis Bauer, Florian Maier
Simulation-assisted decision making for supply chain disruptions in production control
published pages: , ISSN: , DOI:
2020-04-23
2019 Marcel Kunick, Peter Czerner
Interactive Stack Wafer Map with Feature Selection Capabilities
published pages: , ISSN: , DOI:
2020-04-23
2018 all WP leaders
Newsletter SemI40
published pages: , ISSN: , DOI:
2020-04-23
2019 Anna Jenul (Student), Jürgen Pilz (Supervisor UNI-KLU)
Intensity Quanitification of Process Patterns in Wafer Test Data
published pages: , ISSN: , DOI:
2020-04-23
2019 Benjamin Bara
Design and Implementation of IIoT Demonstrators using Hardware Security Extensions
published pages: , ISSN: , DOI:
2020-04-23
2018 Rene Kaiser
Opportunities and Challenges of Video and Video Comunication Technology in Smart Factories
published pages: , ISSN: , DOI:
Proceedings uDAYXVI - Assistenztechnologien in der Arbeitswelt 2020-04-23
2019 Rainer Matischek and Benjamin Bara
Application Study of Hardware-Based Security for Future Industrial IOT
published pages: , ISSN: , DOI:
2020-04-23
2017 Rene Kaiser, Roman Kern, Alexander Stocker
SAMI40 Workshop at i-KNOW 2017 - a Recap
published pages: , ISSN: , DOI:
IKNOW2017 2020-04-23
2019 David Wittwer, Sebastian Rank, Thorsten Schmidt
Impact of Test Wafers in the Transportation System of a Semiconductor Factory
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Anna Jenul, Stefan Schrunner, Anja Zernig, Andre Kaestner, Jürgen Pilz
An Investigation of Statistical Measures for Intensity Comparison of Process Patterns in Analog Wafer Test Data
published pages: , ISSN: , DOI:
2020-04-23
2019 Manfred Rosenberger, Alexander Stocker
Capturing Industry 4.0 Use Cases for interdisciplinary implementation teams
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Silia Maksuti, Oliver Schluga, Giuseppe Settanni, Markus Tauber, Jerker Delsnig
Self-Adaptation Applied to MQTT via GAMF
published pages: , ISSN: , DOI:
2020-04-23
2019 Alessio Mosca, Cristina De Luca, Davide Raimondo
A Scalable Wafer Dispatching Strategy Based on Dynamic Programming
published pages: , ISSN: , DOI:
2020-04-23
2019 Romana Boiger, Matthias Fehr, Gerfried Millner, Manfred Mücke
Estimating wafer chuck angular velocity from video data
published pages: , ISSN: , DOI:
2020-04-23
2018 Anja Zernig, Stefan Schrunner, Martin Pleschberger
Data Science along the semiconductor frontend production
published pages: , ISSN: , DOI:
2020-04-23
2018 Bernd Waschneck, Thomas Altenmüller, Thomas Bauernhansl, Andreas Kyek
Case Study on Operator Compliance to Scheduling Decisions in Semiconductor Manufacturing
published pages: , ISSN: , DOI:
2020-04-23
2018 Germar Schneider
Digitalisierung zur Sicherstellung von Qualitätszielen in der Halbleiterindustrie
published pages: , ISSN: , DOI:
2020-04-23
2018 Alessio Mosca, Davide. M. Raimondo
Stochastic Optimal Power Flow in islanded grids with renewable penetration, energy storage systems and possible curtailments
published pages: , ISSN: , DOI:
2020-04-23
2019 Peter Czerner, Christian Weber
Dimension Reduction using Feature Selection for Root Cause Analysis
published pages: , ISSN: , DOI:
2020-04-23
2019 Andreas Felsberger, Bernhard Oberegger, Christian Wankmüller, Gernot Lechner, Gerald Reiner
The impact of digital technologies on manufacturing performance: A simulation modelling approach
published pages: , ISSN: , DOI:
2020-04-23
2019 Yvonne Bergmann, Florian Tripon
Easy Sensor integration in industrial environments
published pages: , ISSN: , DOI:
Article in SemI40 Book 2020-04-23
2019 Manuela Rauch, Alexander Gaal, Ilija Simic, Vedran Sabol
Evaluation of Visual Decision Support Systems used in Semiconductor Industry
published pages: , ISSN: , DOI:
2020-04-23
2019 Dennis Bauer, Florian Maier, Andreas Schlereth
Transfer of Run-to-Run-Control to Production Control Level in Semiconductor Front-End
published pages: , ISSN: , DOI:
2020-04-23
2019 Igor Stogniy, Wolfgang Scholl
An experimental proof of the substitute route issues for automated long-term simulation model for semiconductor industry
published pages: , ISSN: , DOI:
2020-04-23
2019 Manfred Mücke
Die große Wirkung der kleinsten Teile
published pages: , ISSN: , DOI:
2020-04-23
2019 Robert Muhr, Wolfgang Gratzer, Matthias Fehr, Germar Schneider
Detection of adhesive film residues during wafer demounting
published pages: , ISSN: , DOI:
2020-04-23
2018 Bernd Waschneck, Andre Reichstaller, Lenz Belzner, Thomas Altenmüller, Thomas Bauernhansl, Alexander Knapp, Andreas Kyek
Optimization of global production scheduling with deep reinforcement learning
published pages: , ISSN: , DOI:
2020-04-23
2018 Germar Schneider
Digitalization to Assure Quality Targets within the Semiconductor Industry
published pages: , ISSN: , DOI:
2020-04-23
2018 Cristina De Luca
SemI40 Project Poster
published pages: , ISSN: , DOI:
2020-04-23
2018 Sarah Haas, Anrea Höller, Thomas ULZ, Christian Steger
Inter-Device Sensor-Fusion for Action Authorization on Industrial Mobile Robots
published pages: , ISSN: , DOI:
2020-04-23
2018 Frederic Ringsleben, Maik Benndorf, Thomas Haenselmann
Bestimmung von Objektparametern aus industriellen Bildern mit neuronalen Netzwerken
published pages: , ISSN: , DOI:
2020-04-23
2018 Federica Acerbi, Giuseppe De Nicolao
Identification of the Gordon-Ng Chiller Model: Linear to Nonlinear Least Squares?
published pages: , ISSN: , DOI:
2020-04-23
2018 Anja Zernig
Product health assessment using patterns in semiconductor wafer test data
published pages: , ISSN: , DOI:
2020-04-23
2019 Andreas Schlereth; Thomas Ponsignon, Axel Bruns, Dennis Bauer, Florian Maier
Simulation-assisted decision making for supply chain disruptions in production control
published pages: , ISSN: , DOI:
2020-04-23
2019 Michael Klick, Dirk Suchland, Lutz Eichhorn
Physics and chemistry behind plasma chamber conditioning for predictive maintenance
published pages: , ISSN: , DOI:
2020-04-23
2018 Cristina De Luca
SemI40 & Productive 4.0 Different but Complementary
published pages: , ISSN: , DOI:
2020-04-23
2017 Romana Boiger, Thomas Haenselmann, Manfred Mücke, Frederic Ringsleben
Towards Robust Visual Wafer Cleaning Anomaly Detection
published pages: , ISSN: , DOI:
2020-04-23
2017 Clemens Schwenke; Klaus Kabitzsch
Continuous Flow Transport Scheduling for Conveyor-based AMHS in Wafer Fabs
published pages: , ISSN: , DOI:
2020-04-23
2018 Romana Boiger, Gerfried Millner, Manfred Mücke, Bernat Zaragoza Travieso
Towards Robust Visual Wafer Cleaning Anomaly Detection
published pages: , ISSN: , DOI:
18th European Advanced Process Control and Manufacturing Conference (apc/m) 2020-04-23
2018 Igor Stogniy, Wolfgang Scholl
The granularity of the automated-generated long-term simulation model
published pages: , ISSN: , DOI:
2020-04-23
2017 Carlo Cavalloti, Danilo Crippa
Recent advancements in the automation of CVD reactors for the epitaxial deposition of SI and SIC: snyergy between modeling and experiments
published pages: , ISSN: , DOI:
2020-04-23
2018 Alessio Mosca, Giuseppe De Nicolao, Germar Schneider, Torsten Niekisch, Davide Raimondo
Optimal Wafer Dispatching based on Dynamic Programming
published pages: , ISSN: , DOI:
18th European Advanced Process Control and Manufacturing Conference (apc/m) 2020-04-23
2017 Federica Acerbi; Giuseppe De Nicolao; Cristina De Luca; Josef Obiltschnig; Patrick Richter
Black-box Identification of the Energy Efficiency Ratio of Water-cooled Chillers
published pages: , ISSN: , DOI:
2020-04-23
2017 Oliver Schluga
Implementing Self-Adaptability for Industry 4.0 Environments in Private Clouds
published pages: , ISSN: , DOI:
2020-04-23
2018 Thomas Wagner, Germar Schneider, Klaus Kabitzsch
A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs
published pages: , ISSN: , DOI:
2020-04-23
2018 Florian Roetzer, Alexander Aschauer, Andreas Steinboeck, Andreas Kugi
A Computationally Efficient 3D Mathematical Model of a Molybdenum Batch-Reheating Furnace
published pages: , ISSN: , DOI:
2020-04-23
2017 Anja Zernig
Applicability and robustness of ICA for semiconductor data
published pages: , ISSN: , DOI:
2020-04-23
2018 Thomas Wagner, Germar Schneider, Klaus Kabitzsch
A Web-based Virtualization Toolbox for the Integrated Visualization of Data within Semiconductor Fabs
published pages: , ISSN: , DOI:
18th European Advanced Process Control and Manufacturing Conference (apc/m) 2020-04-23
2018 Lutz Eichhorn, Klick Michael
APC of complex Bosch Process @ SPTS Rapier
published pages: , ISSN: , DOI:
18th European Advanced Process Control and Manufacturing Conference (apc/m) 2020-04-23
2017 Mariana Alexandra de Barcelos
Towards a Security Framework for the Semiconductor Supply Chain Environment
published pages: , ISSN: , DOI:
2020-04-23
2017 Bernd Waschneck; Lee W. F. Brian; Koh C. W. Benny; Christopher Rippler; Gottfried Schmid
Unified Frontend and Backend Industrie 4.0 Roadmap for Semiconductor Manufacturing
published pages: , ISSN: , DOI:
CEUR - Workshop Proceedings - Proceedings of the Workshop Papers of i-Know 2017 co-located with International Conference on Knowledge Technologies and Data-Driven Business 2017 (i-Know 2017) Vol-2025 2020-04-23
2017 Andreas Felsberger, Bernhard Oberegger, Simon Reisinger, Gerald Reiner
Decision Support for Operational Excellence in Manufacturing Systems
published pages: , ISSN: , DOI:
CEUR - Workshop Proceedings - SamI40 – 2nd International Workshop on Science, Application and Methods in Industry 4.0 2020-04-23
2018 Rene Kaiser, Roman Kern, Alexander Stocker
SAMI40 Workshop at i-KNOW 2017 - a Recap
published pages: , ISSN: , DOI:
2020-04-23
2017 Cristina De Luca
SemI40 - Project Description - Success Stories
published pages: , ISSN: , DOI:
2020-04-23
2018 Anja Zernig, Olivia Bluder, Andre Kästner
Product health assessment using patterns in semiconductor wafer test data
published pages: , ISSN: , DOI:
18th European Advanced Process Control and Manufacturing Conference (apc/m) 2020-04-23
2018 L. Custodio, Pedro Vasconcelos, Ricardo Gaio
Pilot line for advance process control with self-learning cross-process root cause analysis
published pages: , ISSN: , DOI:
18th European Advanced Process Control and Manufacturing Conference (apc/m) 2020-04-23
2017 Cristina De Luca
Power Semiconductor and Electronics Manufacturing 4.0
published pages: , ISSN: , DOI:
2020-04-23
2017 Stefan Schrunner; Olivia Bluder; Anja Zernig; Andre Kaestner; Roman Kern
Markov Random Fields for Pattern Extraction in Analog Wafer Test Data
published pages: , ISSN: , DOI:
2020-04-23
2018 Tiago Santos, Roman Kern
Understanding semiconductor produtcion with variational auto-encoders
published pages: , ISSN: , DOI:
2020-04-23
2018 Andreas Felsberger (UNI-KLU), Boualem Rabta (UNI-KLU), Gerald Reiner (UNI-KLU)
Queuing Network Modelling for improved Decision Support in Manufacturing Systems
published pages: , ISSN: , DOI:
20th International Working Seminar on Production Economics 2020-04-23
2018 Germar Schneider, Thomas Wagner , Jens Naake, Sebastian Rank, Frank Schulze
Fab Simulation and Virtualization - The Key to Enhance the Fab Performance within the Semiconductor Industry
published pages: , ISSN: , DOI:
2020-04-23
2018 Dennis Bauer, Florian Maier, Bernd Waschneck
Framework for a Closed Control Loop Between Supply Chain Segments and Production Line
published pages: , ISSN: , DOI:
2020-04-23
2018 Mike Gißrau, Lutz Muche
Statistical KPI Forecast in Semiconductor Manufacturing
published pages: , ISSN: , DOI:
18th European Advanced Process Control and Manufacturing Conference (apc/m) 2020-04-23
2017 Vedo Alagic
Test Pattern Extraction for Semiconductor Wafer Test Data
published pages: , ISSN: , DOI:
2020-04-23
2017 Heimo Gursch, David Cemernek, Roman Kern
Multi-Loop Feedback Hierarchy Involving Human Workers in Manufacturing Processes
published pages: , ISSN: , DOI:
2020-04-23
2017 Manfred Rosenberger, Alexander Stocker
Eine Vorgehensweise zur Unterstützung der Einführung von Industrie 4.0 Technologien
published pages: , ISSN: , DOI:
2020-04-23
2017 Schneider, G.; Keil, S.; Lasch, R.
Advanced Automation of Decision Making Process Flows of Manufacturing Support Processes in the High Tech Industry
published pages: , ISSN: , DOI:
2020-04-23
2017 Stanisavljevic, Darko; Spitzer, Michael
A Review of Related Work on Machine Learning in Semiconductor Manufacturing and Assembly Lines
published pages: , ISSN: , DOI: 10.5281/zenodo.495135
CEUR-Workshop Proceedings VOl-1793 2020-04-23
2016 Schmittner, Christoph; Schoitsch, Erwin
Safety & Security für M2M Kommunikation
published pages: , ISSN: , DOI: 10.5281/zenodo.183187
1 2020-04-23
2017 Maksuti, S.; Bicaku, A.; Tauber, M.; Palkovits-Rauter, S.; Matischek, R.; Schmittner, C.; Mantas, G.; Thron, M.; Delsing; J.
Towards Trustworthy End-to-End Communication in Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2017 Waschneck, Bernd; Bauernhansl, Thomas; Altenmüller, Thomas; Kyek, Andreas
Production Scheduling in Complex Job Shops from an Industrie 4.0 Perspective: A Review and Challenges in the Semiconductor Industry
published pages: , ISSN: , DOI: 10.5281/zenodo.495155
CEUR Workshop Proceedings Vol-1793 2020-04-23
2017 De Luca, C.; Hufeld K.
SemI40 & Productive4.0 ECSEL JU Projects (2016-2020)
published pages: , ISSN: , DOI:
2020-04-23
2017 Santos, Tiago; Kern, Roman
A Literature Survey of Early Time Series Classification and Deep Learning
published pages: , ISSN: , DOI: 10.5281/zenodo.495150
CEUR-Worksop Proceedings Vol-1793 2020-04-23
2017 Bauer, Elisabeth; Bicaku, Ani; Schluga, Oliver; Tauber, Markus; Maksuti, Silia
ENISA Based Evaluation of IaaS-Cloud Backend for Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2017 Maksuti, S.; Bicaku, A.; Tauber, M.; Palkovits-Rauter, S.; Haas, S.; Delsing, J.
Towards Flexible ans Secure End-to-End Communication in Industry 4.0
published pages: , ISSN: , DOI:
2020-04-23
2017 Santos, T.; Walk, S.; Helic, D.
Nonlinear Characterization of Activity Dynamics in Online Collaboration Websites
published pages: , ISSN: , DOI:
2020-04-23
2017 Felsberger, A.; Reiner, G.
The impact of Industry 4.0 on Sustainable Supply & Value Chain Management: A meta analysis
published pages: , ISSN: , DOI:
2020-04-23
2017 Weihrauch, D.; Schindler, P. A.; Sihn, W.
A conceptual model for developing a smart process control system
published pages: , ISSN: , DOI:
2020-04-23
2017 Michael Reinl - FH Burgerland
Evaluation of open source monitoring tools in the cloud and IoT with focus on authentication and security incidents
published pages: , ISSN: , DOI:
2020-04-23
2017 Bauer, D.; Maier, F.; Bauernhansl, T.; Ponsignon, T.; Waschneck, B.; Oberegger, B.; Felsbeger, A.; Reiner, G.
Concept and possible application of an automated framework to influence production dispatch based on supply chain events
published pages: , ISSN: , DOI:
2020-04-23
2016 Schmeja, M.; von Falck, G.; Jeitler, B.
Qualitätsüberwachung und Machinen_Diagnose mittels Big Data Analyse
published pages: , ISSN: , DOI:
2020-04-23
2017 Felsberger, Andreas; Oberegger, Bernhard; Reiner, Gerald
A Review of Decision Support Systems for Manufacturing Systems
published pages: , ISSN: , DOI: 10.5281/zenodo.495120
CEUR- Workshop Proceedings Vol-1793 2020-04-23
2017 Ma, Z.; Hudic, A.; Shaaban, A.; Plosz, S.
Security Viewpoint in a Reference Architecture Model For Cyber-Physical Production Systems
published pages: , ISSN: , DOI:
2020-04-23
2017 Haas, S.; Ulz, T.; Steger, C.; Matischek, R.
Secured Offline Authentication on Industrial Mobile Robots using Biometric Data
published pages: , ISSN: , DOI:
2020-04-23
2017 Ringsleben, F.; Haenselmann, T.
Image based wafer defect analysis
published pages: , ISSN: , DOI:
2020-04-23
2017 Haas, S.; Steger, C.; Matischek, R.
Accessing Industrial Autonomous Robots: A Secured Authentication Approach
published pages: , ISSN: , DOI:
2020-04-23
2017 Haas, S.; Ulz, T.; Matischek, R.; Steger, C.
Industrial IoT Security: A Survey
published pages: , ISSN: , DOI:
2020-04-23
2017 Aschauer, A.; Roetzer, F.; Steinboeck, A.; Kugi, A.
An Efficient Algorithm for Scheduling a Flexible Job Ship with Blocking and No-Wait Constraints
published pages: , ISSN: , DOI:
2020-04-23
2017 Acerbi, F.; De Nicolao, G.; Raimondo, D.; Obiltschnig, J.; Richter, P.; De Luca, C.
Black-box Identification for Efficient Chiller Management in a Semiconductor plant
published pages: , ISSN: , DOI:
2020-04-23

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