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MMAMA SIGNED

Microwave Microscopy for Advanced and Efficient Materials Analysis and Production

Total Cost €

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EC-Contrib. €

0

Partnership

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 MMAMA project word cloud

Explore the words cloud of the MMAMA project. It provides you a very rough idea of what is the project "MMAMA" about.

industry    bulk    microscope    bars    innovation    nanostructured    market    database    microwave    structures    tip    scanning    resonator    efficiency    made    dielectric    products    masked    instruments    photovoltaic    datasets    stages    nanoscale    nano    containing    trustworthy    raw    environments    error    thin    models    calibrated    interface    solving    metrological    simulation    electronic    insights    nanostructures    accelerate    cross    versions    obtaining    coatings    combination    environment    performances    simulations    semiconductors    characterization    additionally    fabrication    predict    checks    prototype    easier    semiconductor    place    translate    lines    complicated    materials    exemplary    cells    hybrid    structural    monitoring    modeling    emmc    film    dimensional    generation    circuits    material    semi    manufacturers    indispensable    interactions    microscopes    electrical    deposition    difficult    solar    platform    superimposed    organization    least    conductor    organic    resonators   

Project "MMAMA" data sheet

The following table provides information about the project.

Coordinator
UNIVERSITE DE LILLE 

There are not information about this coordinator. Please contact Fabio for more information, thanks.

 Coordinator Country France [FR]
 Project website https://www.mmama.eu/
 Total cost 3˙992˙176 €
 EC max contribution 3˙992˙176 € (100%)
 Programme 1. H2020-EU.2.1.3. (INDUSTRIAL LEADERSHIP - Leadership in enabling and industrial technologies - Advanced materials)
 Code Call H2020-NMBP-2017-two-stage
 Funding Scheme RIA
 Starting year 2017
 Duration (year-month-day) from 2017-11-01   to  2020-10-31

 Partnership

Take a look of project's partnership.

# participants  country  role  EC contrib. [€] 
1    UNIVERSITE DE LILLE FR (LILLE) coordinator 544˙322.00
2    UNIVERSITE DES SCIENCES ET TECHNOLOGIES DE LILLE - LILLE I FR (VILLENEUVE D'ASCQ) coordinator 0.00
3    EIDGENOSSISCHES INSTITUT FUR METROLOGIE METAS CH (WABERN) participant 783˙468.00
4    KEYSIGHT TECHNOLOGIES GMBH AT (WIEN) participant 676˙250.00
5    MATERIA NOVA BE (MONS) participant 425˙616.00
6    QWED SPOLKA Z OGRANICZONA ODPOWIEDZIALNOSCIA PL (WARSZAWA) participant 387˙750.00
7    ADAMANT AERODIASTIMIKES EFARMOGES ETAIREIA PERIORISMENIS EFTHYNIS EL (ANO KASTRITSI-PATRAS) participant 344˙000.00
8    DRACULA TECHNOLOGIES FR (VALENCE) participant 339˙693.00
9    EIDGENOESSISCHE TECHNISCHE HOCHSCHULE ZUERICH CH (ZUERICH) participant 291˙700.00
10    AYMING FR (GENNEVILLIERS CEDEX) participant 199˙375.00

Map

 Project objective

Products which require complicated material systems and nanoscale structural organization, e.g. third-generation solar cells, are often difficult to develop. This is because electronic properties of bulk semiconductors are often masked or at least strongly superimposed by material interface properties. Additionally these interface properties are also complex and thus make product design difficult.

This project aims at solving this problem by offering a nanoscale characterization platform for the European manufacturers of coatings, photovoltaic cells, and semi-conductor circuits. It is proposed to use a combination of scanning microwave microscopes, dielectric resonators, and simulation to measure the material and interface properties of complicated material systems and nano-structures. A metrological system of cross-checks between different instruments, models and simulations with associated error bars is indispensable for obtaining trustworthy results.

Scanning microwave measurements will be directly used for three-dimensional characterization of electrical properties of nanostructured semiconductors used in organic and hybrid photovoltaic cells. The objective is to accelerate the development of high efficiency cells and to have measures to predict performances in early stages of prototype production. Where process monitoring of materials with nanostructures is necessary, a dielectric resonator is used to translate insights from scanning microwave microscope measurements to fabrication environments. Such dielectric resonators could be directly integrated in production lines for monitoring thin film deposition processes.

An open innovation environment will make the uptake of the results easier for European industry. A database containing exemplary measurement datasets of scanning microwave microscopes will be available in calibrated and raw versions. Simulation results of tip-semiconductor interactions will be made available on the EMMC Modeling Market Place.

 Deliverables

List of deliverables.
At least three SOPs on setting up and conducting measurements with the SMM, dielectric resonators and coaxial probes to enable a maximum of reproducibility (T6.4) Documents, reports 2020-01-21 16:32:49
\"Newsletter #1 (T7.2)\" Websites, patent fillings, videos etc. 2020-01-21 16:32:49
Project website (T7.2) Websites, patent fillings, videos etc. 2020-01-21 16:32:49
Web interface for open innovation environment (T6.2) Websites, patent fillings, videos etc. 2020-01-21 16:32:49
Calibration software for higher-resolution dielectric resonator imaging of larger-scale film samples and a database of reference data in Gwyddion format (T4.4) Other 2020-01-21 16:32:49
\"Newsletter #2 (T7.2)\" Websites, patent fillings, videos etc. 2020-01-21 16:32:49
\"Minutes of official project meeting #3 (T8.1)\" Documents, reports 2020-01-21 16:32:49

Take a look to the deliverables list in detail:  detailed list of MMAMA deliverables.

 Publications

year authors and title journal last update
List of publications.
2019 Malgorzata Celuch, Wojciech Gwarek, Andrzej Wieckowski
Modelling - based methodology for downscaling dielectric resonator material measurements of material surfaces
published pages: , ISSN: , DOI:
2019 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization, IEEE NEMO2019 2020-03-06
2019 Philippe Lenain, Gilles Dambrine
\"MMAMA_Newsletter#3-Oct 2019\"
published pages: , ISSN: , DOI: 10.5281/zenodo.3539502
2020-01-21
2019 Georg Gramse, Andreas Schönhals, Ferry Kienberger
Nanoscale dipole dynamics of protein membranes studied by broadband dielectric microscopy
published pages: 4303-4309, ISSN: 2040-3364, DOI: 10.1039/c8nr05880f
Nanoscale 11/10 2020-01-21
2019 Smajic, Jasmin; Celuch, Malgorzata; Kienberger, Ferry
MOdelling DAta providing a description for Near-field Excited Semiconductor Structure simulated in project MMAMA
published pages: , ISSN: , DOI: 10.5281/zenodo.2577307
1 2020-01-21
2018 Lenain, Philippe
\" MMAMA_Newsletter#2-Oct 2018 \"
published pages: , ISSN: , DOI: 10.5281/zenodo.2740308
5 2020-01-21
2018 Aurore Niemiec
Deliverable on the project website
published pages: , ISSN: , DOI: 10.5281/zenodo.2581075
1 2020-01-21
2018 Lenain, Philippe
MMAMA_Leaflet
published pages: , ISSN: , DOI: 10.5281/zenodo.2740682
4 2020-01-21

Are you the coordinator (or a participant) of this project? Plaese send me more information about the "MMAMA" project.

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Send me an  email (fabio@fabiodisconzi.com) and I put them in your project's page as son as possible.

Thanks. And then put a link of this page into your project's website.

The information about "MMAMA" are provided by the European Opendata Portal: CORDIS opendata.

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